In this paper, a time-dependent robust optimization model is proposed by introducing a concept of expected interval quality loss as the robustness metric. The purpose is to provide a potential analysis tool for power semiconductor devices involving stochastic processes. Unlike conventional robustness indicators, the metric is formulated by calculating the expectation and variation of the maximal instantaneous quality loss and capturing the auto-correlation of the quality loss over the time interval. In terms of model solving, the time-dependent...
