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Research on IGBT Health Status Assessment

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成果类型:
会议论文
作者:
Zhichun Li;Yifa Sheng;Tongguang Yang
作者机构:
[Zhichun Li; Yifa Sheng] School of Electrical Engineering, Uersity of South China, Hengyang, China
[Tongguang Yang] School of Mechanical and Electrical Engineering, Hunan City University, Yiyang, China
语种:
英文
关键词:
IGBT;Health status;Aging;Monitor
年:
2025
页码:
564-567
会议名称:
2025 4th International Conference on Power System and Energy Technology (ICPSET)
会议论文集名称:
2025 4th International Conference on Power System and Energy Technology (ICPSET)
会议时间:
18 July 2025
会议地点:
Chengdu, China
出版者:
IEEE
ISBN:
979-8-3315-0159-4
机构署名:
本校为其他机构
院系归属:
机械与电气工程学院
摘要:
Fatigue damage occurs during the operation of IGBTs, and the accumulation of fatigue damage accelerates the aging of IGBTs. Aging is an important cause of IGBT failure, so the monitoring of aging parameters of IGBT module is an important means to ensure the stable operation of the system, according to the IGBT module, the current IGBT module health state assessment is summarized and compared. According to the shortcomings of the current research and the current research status, the research dir...

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