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16 Times Over-Sampling Technique Based on the ADC Module of StellarisTM Family of Chips

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成果类型:
期刊论文
作者:
Li, Tu;Jun'An, Liu;Juanjuan, Song
通讯作者:
Li, T.(tulip1907@163.com)
作者机构:
[Li, Tu] Department of Computer Science, Hunan City University, Hunan, Yiyang 413000, China
[Juanjuan, Song] Department of Chemical and Environmental Engineering, Hunan City University, Hunan, Yiyang 413000, China
[Jun'An, Liu] Department of Machinery Engineering, Hunan Institute of Engineering, Hunan, Xiangtan 411101, China
语种:
英文
期刊:
Lecture Notes in Electrical Engineering
ISSN:
1876-1100
年:
2011
卷:
86 LNEE
期:
VOL. 1
页码:
403-408
机构署名:
本校为第一机构
院系归属:
信息与电子工程学院
摘要:
The ADC module with its 10-bit-resolution is integrated into the partial products of Stellaris series microcontroller. But the actual precision obtained is less than 10. This paper provides a software-based general average over-sampling technology which use an oversampling frequency of the cycle timer which is running, timer in the past triggers a sampling frequency conversion to generate an additional clear ADC interrupt, accumulated 16 times in the conversion, this average value of 16 samples, and it will remove global variables and the total sample count variable. This way improve the resul...

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